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dc.contributor.author홍영태en_US
dc.date.accessioned2015-02-24T12:23:53Z-
dc.date.available2015-02-24T12:23:53Z-
dc.date.issued1990en_US
dc.identifier.otherOAK-2015-00009en_US
dc.identifier.urihttp://postech.dcollection.net/jsp/common/DcLoOrgPer.jsp?sItemId=000001897158en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/2389-
dc.descriptionMasteren_US
dc.languagekoren_US
dc.publisher포항공과대학교en_US
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleInP위에 광화학증착된 질화인막의 AES 및 XPS 분석연구en_US
dc.title.alternativeA Study on auger electron and x-ray photoelectron spectroscopy analysis of phosphorus-nitride film deposite on InP surface by photo-cvden_US
dc.typeThesisen_US
dc.contributor.college일반대학원 전자전기공학과en_US
dc.date.degree1990-02en_US
dc.type.docTypeThesis-

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