Electrical conductivity of YSZ film grown by pulsed laser deposition
SCIE
SCOPUS
- Title
- Electrical conductivity of YSZ film grown by pulsed laser deposition
- Authors
- Joo, JH; Choi, GM
- Date Issued
- 2006-04
- Publisher
- ELSEVIER SCIENCE BV
- Abstract
- Yttria-stabilized zirconia (YSZ) thin films, 0.6-1.5 mu m, were deposited on Pt and sapphire substrates by a pulsed laser deposition (PLD) method. Their structural and transport properties have been studied by means of X-ray diffraction and electrical conductivity measurements. The in-plane and the perpendicular-to-plane conductivities (hereafter, "across-plane" conductivity) of thin films were measured and compared to that of bulk sample. X-ray diffraction and electron microscopy results showed that the films on Pt and sapphire were polycrystalline cubic with a columnar structure. Both the across-plane and the in-plane conductivities of YSZ thin film were close to that of bulk specimens. Thus no conductivity enhancement was found for the present nano-crystalline YSZ films (grain or column size, 60 similar to 100 nm). (c) 2006 Elsevier B.V. All rights reserved.
- Keywords
- SOFC; electrical conductivity; thin film; YSZ; PLD; ZIRCONIA THIN-FILMS; OXIDE FUEL-CELLS; ELECTROLYTES; FABRICATION; CERIA
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/23978
- DOI
- 10.1016/j.ssi.2006.04.008
- ISSN
- 0167-2738
- Article Type
- Article
- Citation
- SOLID STATE IONICS, vol. 177, no. 11-12, page. 1053 - 1057, 2006-04
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.