DC Field | Value | Language |
---|---|---|
dc.contributor.author | Weon, BM | - |
dc.contributor.author | Kim, SY | - |
dc.contributor.author | Lee, JL | - |
dc.contributor.author | Je, JH | - |
dc.date.accessioned | 2016-04-01T02:01:43Z | - |
dc.date.available | 2016-04-01T02:01:43Z | - |
dc.date.created | 2009-02-28 | - |
dc.date.issued | 2006-01-02 | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.other | 2006-OAK-0000005604 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/24250 | - |
dc.description.abstract | We study degradation behaviors of luminance and voltage in organic light-emitting diodes. We find that normalized luminance and inverse normalized voltage with time, L(t) and V(t)(-1), follow the stretched exponential decay. On this basis, we derive a general relation of luminance and voltage with time as L(t) = V(t)(-delta(t)), where delta(t) indicates a decay exponent, which is attributed to time-dependent space-charge limitation. Here the observation of higher delta(t) at higher initial luminance explains why luminance decay is faster at higher initial luminance. (c) 2006 American Institute of Physics. | - |
dc.description.statementofresponsibility | X | - |
dc.language | English | - |
dc.publisher | AMER INST PHYSICS | - |
dc.relation.isPartOf | APPLIED PHYSICS LETTERS | - |
dc.title | Evolution of luminance by voltage in organic light-emitting diodes | - |
dc.type | Article | - |
dc.contributor.college | 신소재공학과 | - |
dc.identifier.doi | 10.1063/1.2159563 | - |
dc.author.google | Weon, BM | - |
dc.author.google | Kim, SY | - |
dc.author.google | Lee, JL | - |
dc.author.google | Je, JH | - |
dc.relation.volume | 88 | - |
dc.relation.issue | 1 | - |
dc.contributor.id | 10123980 | - |
dc.relation.journal | APPLIED PHYSICS LETTERS | - |
dc.relation.index | SCI급, SCOPUS 등재논문 | - |
dc.relation.sci | SCI | - |
dc.collections.name | Journal Papers | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | APPLIED PHYSICS LETTERS, v.88, no.1 | - |
dc.identifier.wosid | 000234428100082 | - |
dc.date.tcdate | 2019-01-01 | - |
dc.citation.number | 1 | - |
dc.citation.title | APPLIED PHYSICS LETTERS | - |
dc.citation.volume | 88 | - |
dc.contributor.affiliatedAuthor | Lee, JL | - |
dc.contributor.affiliatedAuthor | Je, JH | - |
dc.identifier.scopusid | 2-s2.0-33645529480 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 4 | - |
dc.description.scptc | 5 | * |
dc.date.scptcdate | 2018-05-121 | * |
dc.type.docType | Article | - |
dc.subject.keywordPlus | DEGRADATION | - |
dc.subject.keywordPlus | DEVICES | - |
dc.subject.keywordPlus | STABILITY | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Physics | - |
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