Measurements of the thickness compressibility of an n-octadecyltriethoxysilane monolayer self-assembled on mica
SCIE
SCOPUS
- Title
- Measurements of the thickness compressibility of an n-octadecyltriethoxysilane monolayer self-assembled on mica
- Authors
- Kim, S; Cho, KW; Curry, JE
- Date Issued
- 2005-08-30
- Publisher
- AMER CHEMICAL SOC
- Abstract
- The surface forces apparatus technique and the Johnson-Kendall-Roberts theory were used to study the elastic properties of an n-octadecyltriethoxysilane self-assembled monolayer (OTE-SAM) on both untreated and plasma-treated mica. Our aim was to measure the thickness compressibilities of OTE monolayers on untreated and plasma-treated mica and to estimate their surface densities and phasestates from the film compressibility. The compressibility moduli of OTE are (0.96 +/- 0.02) x 10(8) N/m(2) on untreated mica and (1.24 +/- 0.06) x 10(8) N/m(2) on plasma-treated mica. This work suggests that the OTE phase-state is pseudocrystalline. In addition, the results from the compressibility measurements in water vapor suggest that the OTE-SAM on both untreated and plasma-treated mica is not homogeneous but rather contains both crystalline polymerized OTE domains and somewhat hydrophilic gaseous regions.
- Keywords
- ALKYLSILANE MONOLAYERS; PLASMA MODIFICATION; ADHESION; SURFACES; FORCE; STABILITY; LIQUID; AGGREGATION; APPARATUS; HUMIDITY
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/24422
- DOI
- 10.1021/LA050689R
- ISSN
- 0743-7463
- Article Type
- Article
- Citation
- LANGMUIR, vol. 21, no. 18, page. 8290 - 8296, 2005-08-30
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- There are no files associated with this item.
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