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Cited 1 time in webofscience Cited 8 time in scopus
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dc.contributor.authorHwu, Y-
dc.contributor.authorJe, JH-
dc.contributor.authorMargaritondo, G-
dc.date.accessioned2016-04-01T02:15:01Z-
dc.date.available2016-04-01T02:15:01Z-
dc.date.created2009-02-28-
dc.date.issued2005-10-01-
dc.identifier.issn0577-9073-
dc.identifier.other2005-OAK-0000004906-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/24751-
dc.description.abstractWe present several examples of the applications of a novel microradiology approach based on unmonochromatized synchrotron x-rays. The approach - mostly implemented on the ICPCIR (International Consortium on Phase Contrast Imaging and Radiology) Beamline at the 7B2 Pohang Light Source in Korea, Phase Contrast Imaging (PCI) beamline of Singapore Synchrotron Light and Source and at the B1 wavelength shifter beamline in NSSRC Hsinchu, Taiwan - allows the real-time analysis of a variety of phenomena on the micron and submicron scale. The practical examples concern materials science, industrial technology, medicine, the life sciences and other areas.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherPHYSICAL SOC REPUBLIC CHINA-
dc.relation.isPartOfCHINESE JOURNAL OF PHYSICS-
dc.subjectSYNCHROTRON-RADIATION-
dc.subjectX-RAYS-
dc.subjectCONTRAST-
dc.subjectTISSUES-
dc.subjectRAT-
dc.titleReal-time radiology in the microscale-
dc.typeArticle-
dc.contributor.college신소재공학과-
dc.identifier.doi10.1016/j.nima.2005.07.066-
dc.author.googleHwu, Y-
dc.author.googleJe, JH-
dc.author.googleMargaritondo, G-
dc.relation.volume43-
dc.relation.issue1-
dc.relation.startpage285-
dc.relation.lastpage292-
dc.contributor.id10123980-
dc.relation.journalCHINESE JOURNAL OF PHYSICS-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameConference Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationCHINESE JOURNAL OF PHYSICS, v.43, no.1, pp.285 - 292-
dc.identifier.wosid000227350900018-
dc.date.tcdate2019-02-01-
dc.citation.endPage292-
dc.citation.number1-
dc.citation.startPage285-
dc.citation.titleCHINESE JOURNAL OF PHYSICS-
dc.citation.volume43-
dc.contributor.affiliatedAuthorJe, JH-
dc.identifier.scopusid2-s2.0-24944584419-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc1-
dc.type.docTypeArticle; Proceedings Paper-
dc.subject.keywordPlusLOCALIZED ELECTROCHEMICAL DEPOSITION-
dc.subject.keywordPlusHARD-X-RAYS-
dc.subject.keywordPlusSYNCHROTRON-RADIATION-
dc.subject.keywordPlusCONTRAST-
dc.subject.keywordPlusELECTRODEPOSITION-
dc.subject.keywordPlusMICRORADIOLOGY-
dc.subject.keywordPlusTOMOGRAPHY-
dc.subject.keywordPlusRESOLUTION-
dc.subject.keywordPlusTISSUES-
dc.subject.keywordPlusRAT-
dc.subject.keywordAuthorphase contrast imaging-
dc.subject.keywordAuthorradiology-
dc.subject.keywordAuthorbroadband synchrotron light-
dc.relation.journalWebOfScienceCategoryPhysics, Multidisciplinary-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

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제정호JE, JUNG HO
Dept of Materials Science & Enginrg
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