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Cited 45 time in webofscience Cited 48 time in scopus
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dc.contributor.authorBaik, S-
dc.contributor.authorKim, HS-
dc.contributor.authorJeong, MH-
dc.contributor.authorLee, CS-
dc.contributor.authorJe, JH-
dc.contributor.authorHwu, Y-
dc.contributor.authorMargaritondo, G-
dc.date.accessioned2016-04-01T02:20:01Z-
dc.date.available2016-04-01T02:20:01Z-
dc.date.created2009-02-28-
dc.date.issued2004-11-
dc.identifier.issn0034-6748-
dc.identifier.other2004-OAK-0000004660-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/24935-
dc.description.abstractWe describe the general characteristics and the first result of a new synchrotron beamline at the Pohang Light Source in Korea. The beamline, operated by a Korean-Taiwanese-Swiss consortium, is dedicated to microimaging experiment in real time with coherent x rays. The performances of the first tests already reach excellent levels when compared to other similar facilities worldwide. The key feature is the use of unmonochromatized x rays to achieve very high lateral and time resolution. (C) 2004 American Institute of Physics.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.relation.isPartOfREVIEW OF SCIENTIFIC INSTRUMENTS-
dc.subjectSYNCHROTRON-RADIATION-
dc.subjectX-RAYS-
dc.titleInternational consortium on phase contrast imaging and radiology beamline at the Pohang Light Source-
dc.typeArticle-
dc.contributor.college신소재공학과-
dc.identifier.doi10.1063/1.1807000-
dc.author.googleBaik, S-
dc.author.googleKim, HS-
dc.author.googleJeong, MH-
dc.author.googleLee, CS-
dc.author.googleJe, JH-
dc.author.googleHwu, Y-
dc.author.googleMargaritondo, G-
dc.relation.volume75-
dc.relation.issue11-
dc.relation.startpage4355-
dc.relation.lastpage4358-
dc.contributor.id10123980-
dc.relation.journalREVIEW OF SCIENTIFIC INSTRUMENTS-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationREVIEW OF SCIENTIFIC INSTRUMENTS, v.75, no.11, pp.4355 - 4358-
dc.identifier.wosid000224962900001-
dc.date.tcdate2019-02-01-
dc.citation.endPage4358-
dc.citation.number11-
dc.citation.startPage4355-
dc.citation.titleREVIEW OF SCIENTIFIC INSTRUMENTS-
dc.citation.volume75-
dc.contributor.affiliatedAuthorBaik, S-
dc.contributor.affiliatedAuthorJe, JH-
dc.identifier.scopusid2-s2.0-10044244519-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc44-
dc.description.scptc46*
dc.date.scptcdate2018-05-121*
dc.type.docTypeArticle-
dc.relation.journalWebOfScienceCategoryInstruments & Instrumentation-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaInstruments & Instrumentation-
dc.relation.journalResearchAreaPhysics-

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제정호JE, JUNG HO
Dept of Materials Science & Enginrg
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