Synthesis and microstructural properties of ZnO nanorods on Ti-buffer layers
SCIE
SCOPUS
- Title
- Synthesis and microstructural properties of ZnO nanorods on Ti-buffer layers
- Authors
- Kwak, CH; Kim, BH; Park, CI; Seo, SY; Kim, SH; Han, SW
- Date Issued
- 2011-01-01
- Publisher
- ELSEVIER SCIENCE BV
- Abstract
- This study examined the structural properties of ZnO nanorods grown on Ti-buffer layers with different surface roughnesses of 1.5 and 4.0 nm. Vertically aligned ZnO nanorods were synthesized on Al2O3 substrates with a Ti-buffer layer by metal-organic chemical vapor deposition. X-ray diffraction revealed the ZnO nanorods grown on a smooth surface to have higher quality and better alignment in the ab-plane than those grown on the rough surface. Field-emission transmission electron microscopy (FE-TEM) measurements revealed a disordered layer at the ZnO/Ti interface. FE-TEM demonstrated that the Ti-buffer layer contained a mixture of ordered and amorphous phases. Energy dispersive spectroscopy (EDS) analysis revealed the Ti-buffer layers to be entirely oxides. (C) 2010 Elsevier B.V. All rights reserved.
- Keywords
- Interfaces; Metal-organic chemical vapor deposition; Zinc compounds; Semiconducting II-VI materials; EPITAXIAL-GROWTH; NANOWIRES; ARRAYS
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/25078
- DOI
- 10.1016/J.JCRYSGRO.2010.10.066
- ISSN
- 0022-0248
- Article Type
- Article
- Citation
- JOURNAL OF CRYSTAL GROWTH, vol. 314, no. 1, page. 264 - 267, 2011-01-01
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- There are no files associated with this item.
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