Local structural, magnetic, and optical properties of Zn1-xFexO thin films
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- Title
- Local structural, magnetic, and optical properties of Zn1-xFexO thin films
- Authors
- Seo, SY; Kwak, CH; Kim, SH; Kim, BH; Park, CI; Park, SH; Han, SW
- Date Issued
- 2010-07-01
- Publisher
- ELSEVIER SCIENCE BV
- Abstract
- High quality Zn1-xFexO thin films were deposited on alpha-sapphire substrates by RF magnetron sputtering. X-ray absorption fine structure measurements showed that the chemical valence of Fe ions in the films was a mixture of 2+ and 3+ states, and Fe ions substituted mainly for the Zn sites in the films. DC-magnetization measurements revealed ferromagnetic properties from 5 to 300 K. The photoluminescence measurements at 15 K showed a sharp main transition peak at 3.35 eV along with a broad impurity peak at 2.45 eV. The structural and magnetization analyses of the Zn1-xFexO films strongly suggested that the ferromagnetism was the intrinsic properties of the films. (C) 2010 Elsevier B.V. All rights reserved.
- Keywords
- Structure; Film; Sputtering; ABSORPTION FINE-STRUCTURE; X-RAY; DOPED ZNO; SEMICONDUCTORS; FERROMAGNETISM
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/25613
- DOI
- 10.1016/J.JCRYSGRO.2010.04.033
- ISSN
- 0022-0248
- Article Type
- Article
- Citation
- JOURNAL OF CRYSTAL GROWTH, vol. 312, no. 14, page. 2093 - 2097, 2010-07-01
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