In-situ and ex-situ ZnO nanorod growth on ZnO homo-buffer layers
SCIE
SCOPUS
- Title
- In-situ and ex-situ ZnO nanorod growth on ZnO homo-buffer layers
- Authors
- Kwak, CH; Kim, BH; Park, SH; Seo, SY; Park, CI; Kim, SH; Han, SW
- Date Issued
- 2009-10-01
- Publisher
- ELSEVIER SCIENCE BV
- Abstract
- Vertically well-aligned ZnO nanorods were fabricated in-situ and ex-situ on ZnO homo-buffer layers using catalyst-free metal-organic chemical vapor deposition. Field-emission electron microscopy measurements demonstrated that the nanorods were well aligned and had a uniform diameter of 70-100 nm depending on the growth temperature, irrespective of growth conditions, in-situ and ex-situ. X-ray diffraction measurements demonstrated that the ZnO nanorods and the ZnO buffer layers had a wurtzite structure, and that the crystal quality of the nanorods grown on a smooth surface was better than that of the nanorods grown on a rough surface. Field-emission transmission electron microscopy measurements revealed the presence of a disordered layer at the interface of the nanorod and the buffer layer. (C) 2009 Elsevier B.V. All rights reserved.
- Keywords
- ZnO; Structure; Buffer layer; MOCVD; Film; Nanorod; THIN-FILMS; NANOWIRES; DEPOSITION; MECHANISM
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/26111
- DOI
- 10.1016/J.JCRYSGRO.2009.08.010
- ISSN
- 0022-0248
- Article Type
- Article
- Citation
- JOURNAL OF CRYSTAL GROWTH, vol. 311, no. 20, page. 4491 - 4494, 2009-10-01
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- There are no files associated with this item.
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