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Cited 6 time in webofscience Cited 7 time in scopus
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dc.contributor.authorKim, YJ-
dc.contributor.authorYang, KB-
dc.contributor.authorKim, YS-
dc.date.accessioned2016-04-01T08:17:37Z-
dc.date.available2016-04-01T08:17:37Z-
dc.date.created2010-01-12-
dc.date.issued2009-11-
dc.identifier.issn0920-5071-
dc.identifier.other2009-OAK-0000019710-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/27649-
dc.description.abstractA via stitching (VS)-electromagnetic bandgap (EBG) is analyzed with the compact circuit modeling method. From this analysis, a compact EBG structure is proposed to mitigate wideband simultaneous switching noise (SSN) in mobile phones. This EBG structure is compact enough to be used in mobile phones. Simulations and measurements show that the proposed EBG structure meets the requirements of stopband characteristics, having a stopband range from 750 MHz to 3.25 GHz with -60 dB suppression.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherVSP BV-
dc.relation.isPartOfJOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS-
dc.subjectPOWER PLANE-
dc.titleWIDEBAND SIMULTANEOUS SWITCHING NOISE SUPPRESSION IN MOBILE PHONES USING MINIATURIZED ELECTROMAGNETIC BANDGAP STRUCTURES-
dc.typeArticle-
dc.contributor.college전자전기공학과-
dc.identifier.doi10.1163/156939309789932331-
dc.author.googleKim, YJ-
dc.author.googleYang, KB-
dc.author.googleKim, YS-
dc.relation.volume23-
dc.relation.issue14-15-
dc.relation.startpage1929-
dc.relation.lastpage1938-
dc.contributor.id10107889-
dc.relation.journalJOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCIE-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationJOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS, v.23, no.14-15, pp.1929 - 1938-
dc.identifier.wosid000272670900011-
dc.date.tcdate2019-02-01-
dc.citation.endPage1938-
dc.citation.number14-15-
dc.citation.startPage1929-
dc.citation.titleJOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS-
dc.citation.volume23-
dc.contributor.affiliatedAuthorKim, YS-
dc.identifier.scopusid2-s2.0-80054768483-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc5-
dc.type.docTypeArticle-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaPhysics-

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김영수KIM, YOUNG SOO
Dept of Electrical Enginrg
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