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Cited 8 time in webofscience Cited 10 time in scopus
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dc.contributor.authorBan, SJ-
dc.contributor.authorKim, SW-
dc.date.accessioned2016-04-01T08:21:15Z-
dc.date.available2016-04-01T08:21:15Z-
dc.date.created2009-11-25-
dc.date.issued2009-08-27-
dc.identifier.issn0013-5194-
dc.identifier.other2009-OAK-0000019377-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/27783-
dc.description.abstractBy minimising the weighted Wilcoxon norm instead of the weighted Euclidean norm as the cost function, two new Wilcoxon adaptive algorithms are presented. The simulation results in a system identification scenario clearly indicate that the proposed algorithms have superior performance compared with the conventional algorithms when the system output data are contaminated by outliers and the input data are highly correlated.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherINST ENGINEERING TECHNOLOGY-IET-
dc.relation.isPartOfELECTRONICS LETTERS-
dc.titleWilcoxon adaptive algorithms for robust identification-
dc.typeArticle-
dc.contributor.college전자전기공학과-
dc.identifier.doi10.1049/el.2009.1556-
dc.author.googleBan, SJ-
dc.author.googleKim, SW-
dc.relation.volume45-
dc.relation.issue18-
dc.relation.startpage958-
dc.relation.lastpage959-
dc.contributor.id10055882-
dc.relation.journalELECTRONICS LETTERS-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationELECTRONICS LETTERS, v.45, no.18, pp.958 - 959-
dc.identifier.wosid000269628500028-
dc.date.tcdate2019-02-01-
dc.citation.endPage959-
dc.citation.number18-
dc.citation.startPage958-
dc.citation.titleELECTRONICS LETTERS-
dc.citation.volume45-
dc.contributor.affiliatedAuthorKim, SW-
dc.identifier.scopusid2-s2.0-69549128162-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc6-
dc.type.docTypeArticle-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-

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김상우KIM, SANG WOO
Dept of Electrical Enginrg
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