ELLIPTICAL MICROPIPES IN SIC REVEALED BY COMPUTER SIMULATING PHASE CONTRAST IMAGES
SCIE
SCOPUS
- Title
- ELLIPTICAL MICROPIPES IN SIC REVEALED BY COMPUTER SIMULATING PHASE CONTRAST IMAGES
- Authors
- Argunova, T; Kohn, V; Jung, JW; Je, JH
- Date Issued
- 2009-08
- Publisher
- WILEY-V C H VERLAG GMBH
- Abstract
- The elliptical micropipes in SiC are studied using Computer simulation of the phase contrast images. The experimental measurements of "white beam" images are performed at third-generation synchrotron radiation source in Pohang, Korea. We reveal that the transmitted X-ray spectrum of a high brilliance with a pronounced maximum at 16 keV enables to form partially coherent images even for transparent objects. The computer simulation allows one to automatically determine the diameters of elliptical cross-sections based on best matches between calculated and experimental intensity profiles. We show that the micropipes studied here have extended elliptical cross-sections, sometimes rotating around the micropipe axis. (C) 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
- Keywords
- SCREW DISLOCATIONS; SYNCHROTRON-RADIATION; SILICON-CARBIDE; RAY; DELINEATION; MICROSCOPY; CRYSTALS; GROWTH; ENERGY; LAYERS
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/28137
- DOI
- 10.1002/pssa.200881609
- ISSN
- 1862-6300
- Article Type
- Article
- Citation
- PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, vol. 206, no. 8, page. 1833 - 1837, 2009-08
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