Observation of slowly decreasing molecular oscillations in ultrathin liquid films using X-ray reflectivity
- Title
- Observation of slowly decreasing molecular oscillations in ultrathin liquid films using X-ray reflectivity
- Date Issued
- 2009-02
- Publisher
- EDP SCIENCES S A
- Abstract
- We studied similar to 0.5 mu m and 30-80 angstrom thick films of a normal dielectric liquid, tetrakis(2-ethylhexoxy) silane (TEHOS), at temperature range 228-286 K, deposited onto silicon ( 111) substrate with native oxide using X-ray reflectivity. TEHOS is spherical with size similar to 10 angstrom, non-polar, non-reactive, and non-entangling
TEHOS has been reported to show interfacial layering at room temperature and surface layering at 0.23 T(c) (T(c) approximate to 950 K). For. lms similar to 0.5 mu m thick, the reflectivity data did not change significantly as a function of temperature
for. lms 30-80 angstrom thick, the re. ectivity data did change. The data could be fitted with an electron density model composed of a minimum necessary number of Gaussians and a uniform density layer with error-function broadened interfaces. When the film thickness is 60-80 angstrom below 246 K, we found that the interface and the surface layering coexist but do not overlap. When the film thickness is 30-40 angstrom below 277 K, they overlap and the electron density pro. le shows slowly decreasing molecular oscillations at the air-liquid interface.
- Keywords
- SURFACE; INTERFACE
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/29035
- DOI
- 10.1140/EPJST/E2009-
- ISSN
- 1951-6355
- Article Type
- Article
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- There are no files associated with this item.
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