DC Field | Value | Language |
---|---|---|
dc.contributor.author | Choi, U | - |
dc.contributor.author | Kim, YJ | - |
dc.contributor.author | Bae, MJ | - |
dc.contributor.author | Kim, YS | - |
dc.date.accessioned | 2016-04-01T08:57:04Z | - |
dc.date.available | 2016-04-01T08:57:04Z | - |
dc.date.created | 2009-03-20 | - |
dc.date.issued | 2008-01 | - |
dc.identifier.issn | 0920-5071 | - |
dc.identifier.other | 2009-OAK-0000011562 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/29123 | - |
dc.description.abstract | This paper proposes novel mesh ground models with circular or rounded-corner apertures as improved versions of the conventional square-mesh apertures. The rounded-corner aperture shape results in a significant improvement in the signal integrity for the frequencies above 7 GHz as confirmed by Finite Element Method simulation and measurements of insertion loss on test devices. Time-domain simulations and measurements of eye patterns also show that for a high speed data rate of 7 Gbps, the rounded-corner aperture shape shows 3 to 4% better transmitting performance than the square aperture. | - |
dc.description.statementofresponsibility | X | - |
dc.language | English | - |
dc.publisher | VSP BV | - |
dc.relation.isPartOf | JOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS | - |
dc.subject | TRANSMISSION-LINES | - |
dc.subject | MICROSTRIP LINES | - |
dc.subject | TIME-DOMAIN | - |
dc.title | ROUNDED-CORNER APERTURE SHAPE OF THE MESHED GROUND PLANES TO IMPROVE SIGNAL INTEGRITY FOR HIGH SPEED SIGNALS | - |
dc.type | Article | - |
dc.contributor.college | 전자전기공학과 | - |
dc.identifier.doi | 10.1163/156939308787522582 | - |
dc.author.google | Choi U., Kim Y.-J., Bae M.-J., Kim Y.-S. | - |
dc.relation.volume | 22 | - |
dc.relation.issue | 16 | - |
dc.relation.startpage | 2147 | - |
dc.relation.lastpage | 2158 | - |
dc.contributor.id | 10107889 | - |
dc.relation.journal | JOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS | - |
dc.relation.index | SCI급, SCOPUS 등재논문 | - |
dc.relation.sci | SCIE | - |
dc.collections.name | Journal Papers | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | JOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS, v.22, no.16, pp.2147 - 2158 | - |
dc.identifier.wosid | 000262841000003 | - |
dc.date.tcdate | 2018-03-23 | - |
dc.citation.endPage | 2158 | - |
dc.citation.number | 16 | - |
dc.citation.startPage | 2147 | - |
dc.citation.title | JOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS | - |
dc.citation.volume | 22 | - |
dc.contributor.affiliatedAuthor | Kim, YS | - |
dc.identifier.scopusid | 2-s2.0-69649094791 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | TRANSMISSION-LINES | - |
dc.subject.keywordPlus | MICROSTRIP LINES | - |
dc.subject.keywordPlus | TIME-DOMAIN | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Physics | - |
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