In situ synchrotron X-ray micro diffraction study of deformation behavior in polycrystalline coppers during uniaxial deformations
SCIE
SCOPUS
- Title
- In situ synchrotron X-ray micro diffraction study of deformation behavior in polycrystalline coppers during uniaxial deformations
- Authors
- Joo, HD; Kim, JS; Kim, KH; Tamura, N; Koo, YM
- Date Issued
- 2004-12
- Publisher
- PERGAMON-ELSEVIER SCIENCE LTD
- Abstract
- The deformation behavior of pure copper polycrystals was investigated by in situ X-ray microdiffraction using synchrotron radiation. Tensile axis rotations of several positions of same grain were observed. Tensile axis movement depends on local position of a grain. This phenomenon may originate from the orientation relation between neighboring grains. (C) 2004 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
- Keywords
- plastic deformation; microdiffraction; tensile axis rotation; polycrystal; slip system
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/29672
- DOI
- 10.1016/j.scriptamat.2004.07.003
- ISSN
- 1359-6462
- Article Type
- Article
- Citation
- SCRIPTA MATERIALIA, vol. 51, no. 12, page. 1183 - 1186, 2004-12
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.