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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Cho T.S | - |
| dc.contributor.author | Yi M.-S | - |
| dc.contributor.author | Noh D.Y | - |
| dc.contributor.author | Don S.J | - |
| dc.contributor.author | Je J.H. | - |
| dc.date.accessioned | 2017-07-19T00:52:45Z | - |
| dc.date.available | 2017-07-19T00:52:45Z | - |
| dc.date.created | 2009-09-01 | - |
| dc.date.issued | 2007-05 | - |
| dc.identifier.issn | 1012-0394 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/31343 | - |
| dc.language | English | - |
| dc.publisher | . | - |
| dc.relation.isPartOf | DIFFUSION AND DEFECT DATA PT.B: SOLID STATE PHENOMENA | - |
| dc.title | Thickness dependence of the crystallization of α-Fe2O3/α-Al2O3(0001) thin films grown by sputtering | - |
| dc.type | Article | - |
| dc.identifier.doi | 10.4028/3-908451-31-0.1213 | - |
| dc.type.rims | ART | - |
| dc.identifier.bibliographicCitation | DIFFUSION AND DEFECT DATA PT.B: SOLID STATE PHENOMENA, v.124, pp.1213 - 1216 | - |
| dc.citation.endPage | 1216 | - |
| dc.citation.startPage | 1213 | - |
| dc.citation.title | DIFFUSION AND DEFECT DATA PT.B: SOLID STATE PHENOMENA | - |
| dc.citation.volume | 124 | - |
| dc.contributor.affiliatedAuthor | Je J.H. | - |
| dc.identifier.scopusid | 2-s2.0-38749117971 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
| dc.type.docType | CONFERENCE PAPER | - |
| dc.description.journalRegisteredClass | scopus | - |
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Related Researcher
- 제정호JE, JUNG HO
- Dept of Materials Science & Enginrg