Full metadata record
DC Field | Value | Language |
dc.contributor.author | Kim | ko |
dc.contributor.author | Nack J. | ko |
dc.date.accessioned | 2017-07-19T07:33:26Z | - |
dc.date.available | 2017-07-19T07:33:26Z | - |
dc.date.created | 2009-03-26 | - |
dc.date.issued | 1991-09 | - |
dc.identifier.citation | INTERNATIONAL JOURNAL OF RAPID SOLIDIFICATION, v.6, no.3-4, pp.175 - 184 | - |
dc.identifier.issn | 0265-0916 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/34041 | - |
dc.language | English | - |
dc.publisher | . | - |
dc.title | Analytical electron microscopy studies of silicide phase in a rapidly solidified Al-8.1Fe-1.8V-0.7Si alloy | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.contributor.localauthor | Kim | - |
dc.contributor.nonIdAuthor | Nack J. | - |
dc.citation.endPage | 184 | - |
dc.citation.number | 3-4 | - |
dc.citation.startPage | 175 | - |
dc.citation.title | INTERNATIONAL JOURNAL OF RAPID SOLIDIFICATION | - |
dc.citation.volume | 6 | - |
dc.identifier.scopusid | 2-S2.0-0026382942 | - |
dc.description.journalClass | 1 | - |
dc.type.docType | Article | - |
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