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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | K. Davami | - |
| dc.contributor.author | S.H. Mir Shah Ghassemi | - |
| dc.contributor.author | R. Shabazian Yassar | - |
| dc.contributor.author | J. S. Lee | - |
| dc.contributor.author | M. Meyyappan | - |
| dc.date.accessioned | 2017-07-19T09:10:26Z | - |
| dc.date.available | 2017-07-19T09:10:26Z | - |
| dc.date.created | 2012-10-11 | - |
| dc.date.issued | 2011-10 | - |
| dc.identifier.issn | 1431-9276 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/34604 | - |
| dc.language | English | - |
| dc.publisher | Cambridge University Press | - |
| dc.relation.isPartOf | Microscopy and Microanalysis | - |
| dc.title | In-Situ TEM Monitoring of Thermal Decomposition in CdTe and ZnTe Nanowires | - |
| dc.type | Article | - |
| dc.identifier.doi | 10.1017/S1431927611010245 | - |
| dc.type.rims | ART | - |
| dc.identifier.bibliographicCitation | Microscopy and Microanalysis, v.17, pp.1874 - 1875 | - |
| dc.citation.endPage | 1875 | - |
| dc.citation.startPage | 1874 | - |
| dc.citation.title | Microscopy and Microanalysis | - |
| dc.citation.volume | 17 | - |
| dc.contributor.affiliatedAuthor | J. S. Lee | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
| dc.type.docType | ARTICLE | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
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- 이정수LEE, JEONG SOO
- Dept of Electrical Enginrg