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Cited 1 time in webofscience Cited 2 time in scopus
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dc.contributor.authorYoung-Jae Jang-
dc.contributor.authorIl-Min Yi-
dc.contributor.authorKim, B-
dc.contributor.authorSim, JY-
dc.contributor.authorPark, HJ-
dc.date.accessioned2017-07-19T12:25:14Z-
dc.date.available2017-07-19T12:25:14Z-
dc.date.created2016-02-22-
dc.date.issued2015-10-
dc.identifier.issn1598-1657-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/35792-
dc.description.abstractH-field EMI measurements have been performed for the single-ended, the differential, and the pseudo-differential signaling on a 11 '' FR4 microstrip line. The pseudo-differential signaling reduces EMI by more than 10 dB compared to the single-ended signaling if the delay mismatch is lower than 5% of a period for a 3 GHz clock signal. Empirical H-field equations for both differential and single-ended signaling showed fair agreements with measurements.-
dc.languageEnglish-
dc.publisher대한전자공학회-
dc.relation.isPartOfJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE-
dc.titleEMI issues in pseudo-differential signaling for SDRAM interface-
dc.typeArticle-
dc.identifier.doi10.5573/JSTS.2015.15.5.455-
dc.type.rimsART-
dc.identifier.bibliographicCitationJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.15, no.5, pp.455 - 462-
dc.identifier.wosid000366061700004-
dc.date.tcdate2019-03-01-
dc.citation.endPage462-
dc.citation.number5-
dc.citation.startPage455-
dc.citation.titleJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE-
dc.citation.volume15-
dc.contributor.affiliatedAuthorKim, B-
dc.contributor.affiliatedAuthorSim, JY-
dc.contributor.affiliatedAuthorPark, HJ-
dc.identifier.scopusid2-s2.0-84945932346-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc1-
dc.description.scptc2*
dc.date.scptcdate2018-05-121*
dc.type.docTypeArticle-
dc.subject.keywordAuthorEMI-
dc.subject.keywordAuthorpseudo-differential signaling-
dc.subject.keywordAuthorH-field measurement-
dc.subject.keywordAuthorSDRAM interface-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.description.journalRegisteredClasskci-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaPhysics-

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김병섭KIM, BYUNGSUB
Dept of Electrical Enginrg
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