Open Access System for Information Sharing

Login Library

 

Article
Cited 28 time in webofscience Cited 34 time in scopus
Metadata Downloads
Full metadata record
Files in This Item:
DC FieldValueLanguage
dc.contributor.authorMuhammad Kashif-
dc.contributor.authorMuhammad Aslam-
dc.contributor.authorAli Hussein Al-Marshadi-
dc.contributor.authorChi-Hyuck Jun-
dc.date.accessioned2017-07-19T13:27:58Z-
dc.date.available2017-07-19T13:27:58Z-
dc.date.created2017-02-01-
dc.date.issued2016-11-
dc.identifier.issn2169-3536-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/37027-
dc.description.abstractThis paper investigates the efficiency of Gini's mean difference (GMD) as a measure of variability in two commonly used process capability indices (PCIs), i.e., Cp and Cpk. A comparison has been carried out to evaluate the performance of GMD-based PCIs and Pearn and Chen quantile-based PCIs under low, moderate, and high asymmetry using Weibull distribution. The simulation results, under low and moderate asymmetric condition, indicate that GMD-based PCIs are more close to target values than quantile approach. Beside point estimation, nonparametric bootstrap confidence intervals, such as standard, percentile, and bias corrected percentile with their coverage probabilities also have been calculated. Using quantile approach, bias corrected percentile (BCPB) method is more effective for both Cp and Cpk, where as in case of GMD, both BCPB and percentile bootstrap method can be used to estimate the confidence interval of Cp and Cpk, respectively.-
dc.languageEnglish-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.relation.isPartOfIEEE Access-
dc.titleCapability Indices for Non-Normal Distribution using Gini’s Mean Difference as Measure of Variability-
dc.typeArticle-
dc.identifier.doi10.1109/ACCESS.2016.2620241-
dc.type.rimsART-
dc.identifier.bibliographicCitationIEEE Access, v.4, pp.7322 - 7330-
dc.identifier.wosid000392945300001-
dc.date.tcdate2019-02-01-
dc.citation.endPage7330-
dc.citation.startPage7322-
dc.citation.titleIEEE Access-
dc.citation.volume4-
dc.contributor.affiliatedAuthorChi-Hyuck Jun-
dc.identifier.scopusid2-s2.0-85013278155-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc3-
dc.description.scptc3*
dc.date.scptcdate2018-05-121*
dc.description.isOpenAccessY-
dc.type.docTypeARTICLE-
dc.subject.keywordPlusCLEMENTS-
dc.subject.keywordPlusQUALITY-
dc.subject.keywordAuthorGini&apos-
dc.subject.keywordAuthors mean difference-
dc.subject.keywordAuthorprocess capability indices-
dc.subject.keywordAuthornon-normal-
dc.subject.keywordAuthorWeibull distribution-
dc.relation.journalWebOfScienceCategoryComputer Science, Information Systems-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryTelecommunications-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaComputer Science-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaTelecommunications-

qr_code

  • mendeley

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher

전치혁JUN, CHI HYUCK
Dept of Industrial & Management Enginrg
Read more

Views & Downloads

Browse