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Cited 7 time in webofscience Cited 6 time in scopus
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dc.contributor.authorSeungho Han-
dc.contributor.authorSooeun Lee-
dc.contributor.authorMinsoo Choi-
dc.contributor.authorSim, JY-
dc.contributor.authorPark, HJ-
dc.contributor.authorKim, B-
dc.date.accessioned2017-07-19T13:43:19Z-
dc.date.available2017-07-19T13:43:19Z-
dc.date.created2017-02-20-
dc.date.issued2016-08-
dc.identifier.issn0018-9200-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/37456-
dc.description.abstractThis paper proposes a new feed-forward equalizing (FFE) transmitter (Tx) for a massively parallel I/Os to reduce calibration circuits and to save power consumption. The proposed FFE Tx improves its robustness to a coefficient error and its power efficiency by utilizing a high-pass digital difference filter and a channel loss to attenuate the effects of the coefficient errors. To verify the proposed FFE architecture, we fabricated the conventional and the proposed FFEs in 65 nm CMOS technology and tested eye sensitivity and eye variation at 8 Gb/s on 25 dB, 13.2 dB, and 9.6 dB PCB traces. Compared to the conventional FFE Tx, the proposed FFE Tx improves the eye sensitivity and the eye variation by about 230% on a 25 dB lossy channel without calibration. In addition, this improvement increases as the channel loss increases. The proposed FFE Tx also improves the power efficiency by 230% at 25% utilization on a 25 dB lossy channel. These results imply that the proposed FFE Tx can reduce calibration circuits in a massively parallel I/Os and the power consumption.-
dc.languageEnglish-
dc.publisherIEEE-
dc.relation.isPartOfIEEE Journal of Solid-State Circuits-
dc.titleA Coefficient-Error-Robust Feed Forward Equalizing Transmitter for Eye-variation and Power Improvement-
dc.typeArticle-
dc.identifier.doi10.1109/JSSC.2016.2574806-
dc.type.rimsART-
dc.identifier.bibliographicCitationIEEE Journal of Solid-State Circuits, v.51, no.8, pp.1902 - 1914-
dc.identifier.wosid000382169400015-
dc.date.tcdate2019-02-01-
dc.citation.endPage1914-
dc.citation.number8-
dc.citation.startPage1902-
dc.citation.titleIEEE Journal of Solid-State Circuits-
dc.citation.volume51-
dc.contributor.affiliatedAuthorSeungho Han-
dc.contributor.affiliatedAuthorSooeun Lee-
dc.contributor.affiliatedAuthorMinsoo Choi-
dc.contributor.affiliatedAuthorSim, JY-
dc.contributor.affiliatedAuthorPark, HJ-
dc.contributor.affiliatedAuthorKim, B-
dc.identifier.scopusid2-s2.0-84976315942-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc2-
dc.description.scptc0*
dc.date.scptcdate2018-05-121*
dc.type.docTypeArticle-
dc.subject.keywordPlusSERIAL-LINK TRANSCEIVER-
dc.subject.keywordPlusEQUALIZATION-
dc.subject.keywordPlusEFFICIENT-
dc.subject.keywordAuthorCoefficient error-
dc.subject.keywordAuthoreye sensitivity-
dc.subject.keywordAuthorfeed-forward equalization-
dc.subject.keywordAuthorhigh-speed interconnect-
dc.subject.keywordAuthorrobustness-
dc.subject.keywordAuthorvariation-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-

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김병섭KIM, BYUNGSUB
Dept of Electrical Enginrg
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