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dc.contributor.authorHan, H-
dc.contributor.authorDavies, G-
dc.contributor.authorAkalin, T-
dc.contributor.authorTanaka, K-
dc.date.accessioned2017-07-19T13:53:06Z-
dc.date.available2017-07-19T13:53:06Z-
dc.date.created2017-02-28-
dc.date.issued2016-05-
dc.identifier.issn2156-342X-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/37800-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.relation.isPartOfIEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY-
dc.titleIntroduction to the Special Issue on Terahertz Near-Field Microscopy and Applications-
dc.typeArticle-
dc.identifier.doi10.1109/TTHZ.2016.2549861-
dc.type.rimsART-
dc.identifier.bibliographicCitationIEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY, v.6, no.3, pp.353 - 355-
dc.identifier.wosid000379752200001-
dc.date.tcdate2018-03-23-
dc.citation.endPage355-
dc.citation.number3-
dc.citation.startPage353-
dc.citation.titleIEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY-
dc.citation.volume6-
dc.contributor.affiliatedAuthorHan, H-
dc.identifier.scopusid2-s2.0-84976384075-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.scptc0*
dc.date.scptcdate2018-05-121*
dc.type.docTypeEditorial Material-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryOptics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaOptics-
dc.relation.journalResearchAreaPhysics-

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한해욱HAN, HAEWOOK
Dept of Electrical Enginrg
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