DC Field | Value | Language |
---|---|---|
dc.contributor.author | Han, H | - |
dc.contributor.author | Davies, G | - |
dc.contributor.author | Akalin, T | - |
dc.contributor.author | Tanaka, K | - |
dc.date.accessioned | 2017-07-19T13:53:06Z | - |
dc.date.available | 2017-07-19T13:53:06Z | - |
dc.date.created | 2017-02-28 | - |
dc.date.issued | 2016-05 | - |
dc.identifier.issn | 2156-342X | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/37800 | - |
dc.language | English | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.relation.isPartOf | IEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY | - |
dc.title | Introduction to the Special Issue on Terahertz Near-Field Microscopy and Applications | - |
dc.type | Article | - |
dc.identifier.doi | 10.1109/TTHZ.2016.2549861 | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | IEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY, v.6, no.3, pp.353 - 355 | - |
dc.identifier.wosid | 000379752200001 | - |
dc.date.tcdate | 2018-03-23 | - |
dc.citation.endPage | 355 | - |
dc.citation.number | 3 | - |
dc.citation.startPage | 353 | - |
dc.citation.title | IEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY | - |
dc.citation.volume | 6 | - |
dc.contributor.affiliatedAuthor | Han, H | - |
dc.identifier.scopusid | 2-s2.0-84976384075 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.scptc | 0 | * |
dc.date.scptcdate | 2018-05-121 | * |
dc.type.docType | Editorial Material | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Optics | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Optics | - |
dc.relation.journalResearchArea | Physics | - |
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