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Cited 5 time in webofscience Cited 5 time in scopus
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dc.contributor.authorKwon, Ik-Hwan-
dc.contributor.authorLim, Jun-
dc.contributor.authorHong, Chung-Ki-
dc.date.accessioned2017-07-19T13:58:11Z-
dc.date.available2017-07-19T13:58:11Z-
dc.date.created2017-03-09-
dc.date.issued2016-09-
dc.identifier.issn1600-5775-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/37959-
dc.description.abstractAn alignment method for correction of the axial and radial runout errors of the rotation stage in X-ray phase-contrast computed tomography has been developed. Only intensity information was used, without extra hardware or complicated calculation. Notably, the method, as demonstrated herein, can utilize the halo artifact to determine displacement.-
dc.languageEnglish-
dc.publisherJohn Wiley & Sons, Inc.-
dc.relation.isPartOfJOURNAL OF SYNCHROTRON RADIATION-
dc.titleRunout error correction in tomographic reconstruction by intensity summation method-
dc.typeArticle-
dc.identifier.doi10.1107/S1600577516009140-
dc.type.rimsART-
dc.identifier.bibliographicCitationJOURNAL OF SYNCHROTRON RADIATION, v.23, no.5, pp.1237 - 1240-
dc.identifier.wosid000382299500026-
dc.date.tcdate2019-02-01-
dc.citation.endPage1240-
dc.citation.number5-
dc.citation.startPage1237-
dc.citation.titleJOURNAL OF SYNCHROTRON RADIATION-
dc.citation.volume23-
dc.contributor.affiliatedAuthorHong, Chung-Ki-
dc.identifier.scopusid2-s2.0-84984910864-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc3-
dc.description.scptc3*
dc.date.scptcdate2018-05-121*
dc.type.docTypeArticle-
dc.subject.keywordPlusX-RAY MICROSCOPY-
dc.subject.keywordPlusPHASE-CONTRAST-
dc.subject.keywordPlusNANOSCALE-
dc.subject.keywordPlusIMAGES-
dc.subject.keywordAuthortomography-
dc.subject.keywordAuthorrunout error-
dc.subject.keywordAuthorhalo artifact-
dc.subject.keywordAuthorimaging alignment-
dc.relation.journalWebOfScienceCategoryInstruments & Instrumentation-
dc.relation.journalWebOfScienceCategoryOptics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaInstruments & Instrumentation-
dc.relation.journalResearchAreaOptics-
dc.relation.journalResearchAreaPhysics-

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