Boundary Migration Induced Plasticity during Recrytallization and Growth under Applied Stress
SCIE
SCOPUS
- Title
- Boundary Migration Induced Plasticity during Recrytallization and Growth under Applied Stress
- Authors
- Se Jong Kim; Yi Gil Cho; Dong Woo Suh; Sung Joon Kim; Gyo Sung Kim; Heung Nam Han
- Date Issued
- 2007-10
- Publisher
- TTP
- Abstract
- In general, plastic strain occurs over a certain stress, called yield stress. However, it has been reported that the permanent strain could happen during boundary migrating even under the extremely slight externally applied stress. In this study, we performed dilatometry experiments under the various compressive stresses and measured the amount of recrystallization and growth induced permanent strain. A new empirical constitutive equation was suggested to describe the recrystallization and growth induced plasticity. This equation was verified by comparing the calculated values with dilatometric experimental data under the various compressive stresses.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/38619
- DOI
- 10.4028/www.scientific.net/MSF.558-559.533
- ISSN
- 0255-5476
- Article Type
- Article
- Citation
- MATERIALS SCIENCE FORUM, vol. 558-559, page. 533 - 537, 2007-10
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- There are no files associated with this item.
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