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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Y. S. Yang | - |
| dc.contributor.author | J. G. Bae | - |
| dc.contributor.author | C. G. Park | - |
| dc.date.accessioned | 2018-01-08T03:17:24Z | - |
| dc.date.available | 2018-01-08T03:17:24Z | - |
| dc.date.created | 2009-03-26 | - |
| dc.date.issued | 2007-10 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/39474 | - |
| dc.language | English | - |
| dc.publisher | Trans Tech Publications, Switzerland | - |
| dc.relation.isPartOf | ADVANCED MATERIALS RESEARCH | - |
| dc.title | Measurement of Residual Stress in Thin-sized Steel Wires by using Focused Ion Beam and Digital Image Correlation Method | - |
| dc.type | Article | - |
| dc.identifier.doi | 10.4028/0-87849-463-4.1187 | - |
| dc.type.rims | ART | - |
| dc.identifier.bibliographicCitation | ADVANCED MATERIALS RESEARCH, v.26, pp.1187 - 1190 | - |
| dc.citation.endPage | 1190 | - |
| dc.citation.startPage | 1187 | - |
| dc.citation.title | ADVANCED MATERIALS RESEARCH | - |
| dc.citation.volume | 26 | - |
| dc.contributor.affiliatedAuthor | C. G. Park | - |
| dc.identifier.scopusid | 2-s2.0-57649084593 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalRegisteredClass | scopus | - |
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Related Researcher
- 박찬경PARK, CHAN GYUNG
- Dept of Materials Science & Enginrg