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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 임근배 | - |
| dc.contributor.author | 조윤경 | - |
| dc.date.accessioned | 2018-01-09T04:38:35Z | - |
| dc.date.available | 2018-01-09T04:38:35Z | - |
| dc.date.created | 2013-03-12 | - |
| dc.date.issued | 2000-11 | - |
| dc.identifier.issn | 1225-9071 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/40451 | - |
| dc.language | Korean | - |
| dc.publisher | 한국정밀공학회 | - |
| dc.relation.isPartOf | 한국정밀공학회지 | - |
| dc.title | 유전자 진단을 위한 칩 위의 실험실 | - |
| dc.type | Article | - |
| dc.type.rims | ART | - |
| dc.identifier.bibliographicCitation | 한국정밀공학회지, v.17, no.11, pp.25 - 35 | - |
| dc.citation.endPage | 35 | - |
| dc.citation.number | 11 | - |
| dc.citation.startPage | 25 | - |
| dc.citation.title | 한국정밀공학회지 | - |
| dc.citation.volume | 17 | - |
| dc.contributor.affiliatedAuthor | 임근배 | - |
| dc.description.journalClass | 2 | - |
| dc.description.journalClass | 2 | - |
| dc.type.docType | ARTICLE | - |
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Related Researcher
- 임근배LIM, GEUN BAE
- Dept of Mechanical Enginrg