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dc.contributor.authorSoo Young Kim-
dc.contributor.authorJong Lam Lee-
dc.date.accessioned2018-01-09T08:55:52Z-
dc.date.available2018-01-09T08:55:52Z-
dc.date.created2009-03-26-
dc.date.issued2005-01-
dc.identifier.issn1738-8090-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/40795-
dc.languageEnglish-
dc.publisher대한금속재료학회-
dc.relation.isPartOfELECTRONIC MATERIALS LETTERS-
dc.titleDIRECT EVIDENCE OF HOLE INJECTION ENHANCED BY O3 PLASMA TREATMENT ON INDIUM TIN OXDE-
dc.typeArticle-
dc.type.rimsART-
dc.identifier.bibliographicCitationELECTRONIC MATERIALS LETTERS, v.1, no.1, pp.59 - 62-
dc.citation.endPage62-
dc.citation.number1-
dc.citation.startPage59-
dc.citation.titleELECTRONIC MATERIALS LETTERS-
dc.citation.volume1-
dc.contributor.affiliatedAuthorJong Lam Lee-
dc.description.journalClass1-
dc.description.journalClass1-

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이종람LEE, JONG LAM
Dept of Materials Science & Enginrg
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