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dc.contributor.authorHaewook Han-
dc.date.accessioned2018-05-11T04:24:47Z-
dc.date.available2018-05-11T04:24:47Z-
dc.date.created2018-03-05-
dc.date.issued2015-08-25-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/43343-
dc.description.abstractCombined with THz time-domain spectroscopy, THz near-field microscopy based on an atomic force microscope is a technique that, while challenging to implement, is invaluable for probing low-energy light-matter interactions of solid-state and biomolecular nanostructures, which are usually embedded in background media. Here, we experimentally demonstrate a broadband THz pulse near-field microscope that provides subsurface nanoimaging with a nearly frequency-independent lateral resolution of 90 nm, corresponding to -X/3300 at 1 THz.-
dc.languageEnglish-
dc.publisherInternational Conference on Infrared, Millimeter, and Terahertz waves-
dc.relation.isPartOf40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz)-
dc.relation.isPartOfProceeding, International Conference on Infrared, Millimeter, and Terahertz waves-
dc.titleSubsurface nanoimaging by THz pulse near-field microscopy-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitation40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz)-
dc.citation.conferenceDate2015-08-23-
dc.citation.conferencePlaceHK-
dc.citation.conferencePlaceHong Kong-
dc.citation.title40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz)-
dc.contributor.affiliatedAuthorHaewook Han-
dc.description.journalClass1-
dc.description.journalClass1-

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한해욱HAN, HAEWOOK
Dept of Electrical Enginrg
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