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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Yeo, Kunmin | - |
| dc.contributor.author | Chi-Hyuck Jun | - |
| dc.date.accessioned | 2018-05-11T09:15:15Z | - |
| dc.date.available | 2018-05-11T09:15:15Z | - |
| dc.date.created | 2009-03-26 | - |
| dc.date.issued | 2000-01 | - |
| dc.identifier.issn | 1598-0073 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/43452 | - |
| dc.language | English | - |
| dc.publisher | 한국신뢰성학회 | - |
| dc.relation.isPartOf | INTERNATIONAL JOURNAL OF RELIABILITY AND APPLICATION | - |
| dc.title | ANALYSIS OF SYSTEM LIFETIME SUBJECT TO TWO CLASSES OF RANDOM SHOCKS | - |
| dc.type | Article | - |
| dc.type.rims | ART | - |
| dc.identifier.bibliographicCitation | INTERNATIONAL JOURNAL OF RELIABILITY AND APPLICATION, v.1, no.1, pp.49 - 64 | - |
| dc.citation.endPage | 64 | - |
| dc.citation.number | 1 | - |
| dc.citation.startPage | 49 | - |
| dc.citation.title | INTERNATIONAL JOURNAL OF RELIABILITY AND APPLICATION | - |
| dc.citation.volume | 1 | - |
| dc.contributor.affiliatedAuthor | Chi-Hyuck Jun | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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- 전치혁JUN, CHI HYUCK
- Dept of Industrial & Management Enginrg