A Defect Inspection Method for TFT panel using the Compute Unified Device Architecture (CUDA)
- Title
- A Defect Inspection Method for TFT panel using the Compute Unified Device Architecture (CUDA)
- Authors
- 박부견; 정창기; 유진유
- Date Issued
- 2009-07-07
- Publisher
- IEEE KOREA
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/45953
- Article Type
- Conference
- Citation
- IEEE International Symposium on Industrial Electronics (ISlE 2009), 2009-07-07
- Files in This Item:
- There are no files associated with this item.
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