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dc.contributor.author김영환-
dc.contributor.author김욱-
dc.contributor.author박현수-
dc.contributor.author현대준-
dc.date.accessioned2018-05-23T14:54:50Z-
dc.date.available2018-05-23T14:54:50Z-
dc.date.created2010-05-06-
dc.date.issued2007-10-25-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/46114-
dc.publisherNEXT-
dc.relation.isPartOfNEXT 2007-
dc.relation.isPartOfNEXT 2007, Seoul, Korea-
dc.titleInvestigation on the Non-Lognormal Leakage Characteristic of the Leakage Current Distribution under Process Variation-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitationNEXT 2007-
dc.citation.conferenceDate2007-10-25-
dc.citation.titleNEXT 2007-
dc.contributor.affiliatedAuthor김영환-
dc.contributor.affiliatedAuthor김욱-
dc.contributor.affiliatedAuthor박현수-
dc.contributor.affiliatedAuthor현대준-
dc.description.journalClass1-
dc.description.journalClass1-

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김영환KIM, YOUNG HWAN
Dept of Electrical Enginrg
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