Hot Electron Degradation Effects in 35-nm InAlAs/InGaAs Metamorphic HEMT
- Title
- Hot Electron Degradation Effects in 35-nm InAlAs/InGaAs Metamorphic HEMT
- Authors
- 정윤하
- Date Issued
- 2009-11-28
- Publisher
- IEEK
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/46259
- Article Type
- Conference
- Citation
- 2009 IEEK FALL CONFERENCE, 2009-11-28
- Files in This Item:
- There are no files associated with this item.
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