DC Field | Value | Language |
---|---|---|
dc.contributor.author | 김종규 | - |
dc.contributor.author | Y. Xi | - |
dc.contributor.author | J.-Q. Xi | - |
dc.contributor.author | T. Gessmann | - |
dc.contributor.author | J. M. Shah | - |
dc.contributor.author | E. Fred Schubert | - |
dc.contributor.author | A. J. Fischer | - |
dc.contributor.author | M. H. Crawford | - |
dc.contributor.author | K. H. A. Bogart | - |
dc.contributor.author | A. A. Allerman | - |
dc.date.accessioned | 2018-05-23T15:33:08Z | - |
dc.date.available | 2018-05-23T15:33:08Z | - |
dc.date.created | 2010-06-02 | - |
dc.date.issued | 2005-03-17 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/46782 | - |
dc.publisher | Connecticut Symposium on Microelectronics and Optoelectronics | - |
dc.relation.isPartOf | Connecticut Symposium on Microelectronics and Optoelectronics | - |
dc.title | Junction temperature and thermal resistance measurement in deep-UV light-emitting diodes | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | Connecticut Symposium on Microelectronics and Optoelectronics | - |
dc.citation.conferenceDate | 2005-03-17 | - |
dc.citation.conferencePlace | US | - |
dc.citation.title | Connecticut Symposium on Microelectronics and Optoelectronics | - |
dc.contributor.affiliatedAuthor | 김종규 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
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