A Study on Carrier Injection Velocity in sub-100nm SiGe Channel pMOSFETs Using RF C-V Measurement
- Title
- A Study on Carrier Injection Velocity in sub-100nm SiGe Channel pMOSFETs Using RF C-V Measurement
- Authors
- 정윤하
- Date Issued
- 2010-06-17
- Publisher
- 대한전자공학회
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/47121
- Article Type
- Conference
- Citation
- 2010년도 대한전자공학회 하계종합학술대회, page. 597 - 598, 2010-06-17
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.