Characterization and local structure analysis of carbon coated SiOx using confocal μ-Raman microscopy
- Title
- Characterization and local structure analysis of carbon coated SiOx using confocal μ-Raman microscopy
- Authors
- 강병우; 김정한
- Date Issued
- 2016-04-07
- Publisher
- 한국전기화학회
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/49526
- Article Type
- Conference
- Citation
- 춘계 한국전기화학회, 2016-04-07
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.