In-situ TEM study of nano-scale conductive filament used for threshold selector device
- Title
- In-situ TEM study of nano-scale conductive filament used for threshold selector device
- Authors
- 박찬경; 채병규
- Date Issued
- 2016-05-23
- Publisher
- MST33, AAT39
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/49618
- Article Type
- Conference
- Citation
- 11th Asia-Pacific Microscopy Conference, 2016-05-23
- Files in This Item:
- There are no files associated with this item.
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