Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김오현 | - |
| dc.date.accessioned | 2018-05-24T11:38:50Z | - |
| dc.date.available | 2018-05-24T11:38:50Z | - |
| dc.date.created | 2017-02-28 | - |
| dc.date.issued | 2016-05-30 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/49719 | - |
| dc.publisher | ECS | - |
| dc.relation.isPartOf | ECS meeting | - |
| dc.title | Mechanism of Hump Phenomenon in the I-V Characteristics of Amorphous in-Ga-Zn-O Thin Film Transistors Under Positive Bias and Illumination Stress | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | ECS meeting | - |
| dc.citation.conferenceDate | 2016-05-29 | - |
| dc.citation.conferencePlace | US | - |
| dc.citation.title | ECS meeting | - |
| dc.contributor.affiliatedAuthor | 김오현 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 김오현KIM, OHYUN
- Dept of Electrical Enginrg