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Conference
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dc.contributor.author김종규-
dc.contributor.authorK. A. Rickert-
dc.contributor.authorF. J. Himpsel-
dc.contributor.authorA. B. Ellis-
dc.contributor.authorJ. –L. Lee-
dc.contributor.authorT. F. Kuech-
dc.date.accessioned2018-06-17T09:36:21Z-
dc.date.available2018-06-17T09:36:21Z-
dc.date.created2009-09-16-
dc.date.issued2001-08-01-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/56506-
dc.publisherAbstracts of papers of the American Chemical Society-
dc.relation.isPartOfAbstracts of papers of the American Chemical Society-
dc.relation.isPartOfABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY-
dc.titleFermi level pinning and band bending determination via X-ray photoemission spectroscopy-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitationAbstracts of papers of the American Chemical Society, pp.598-
dc.citation.conferencePlaceUS-
dc.citation.startPage598-
dc.citation.titleAbstracts of papers of the American Chemical Society-
dc.contributor.affiliatedAuthor김종규-
dc.description.journalClass1-
dc.description.journalClass1-

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김종규KIM, JONG KYU
Dept of Materials Science & Enginrg
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