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Microwave ellipsometry를 이용한 평판형 시료의 유전율과 두께 측정법
- Title
- Microwave ellipsometry를 이용한 평판형 시료의 유전율과 두께 측정법
- Date Issued
- 2010-11-26
- Publisher
- 한국전자파학회
- Article Type
- Conference
- Citation
- 2010년 종합학술발표회, 2010-11-26
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Related Researcher
- 박위상PARK, WEE SANG
- Dept of Electrical Enginrg