Improving the Process Variation Tolerability of Flip-Flops for UDSM Circuit Design
- Title
- Improving the Process Variation Tolerability of Flip-Flops for UDSM Circuit Design
- Authors
- 김영환; 황은주; 김욱
- Date Issued
- 2010-05-24
- Publisher
- ISQED
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/57325
- Article Type
- Conference
- Citation
- The 11th International Symposium on Quality Electronic Design (ISQED 2010), page. 812 - 817, 2010-05-24
- Files in This Item:
- There are no files associated with this item.
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