Interfacial Strain Analysis and Spatial Distribution of Geometrical Misfit Dislocations in a GaN/Sapphire Interface
- Title
- Interfacial Strain Analysis and Spatial Distribution of Geometrical Misfit Dislocations in a GaN/Sapphire Interface
- Authors
- 오상호; 김영민; 유승조; 유인근; 유석재
- Date Issued
- 2010-09-22
- Publisher
- International Microscopy Congress
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/57466
- Article Type
- Conference
- Citation
- 17th International Microscopy Congress (IMC 17), 2010-09-22
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.