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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 강봉구 | - |
| dc.contributor.author | 이남현 | - |
| dc.date.accessioned | 2018-06-18T03:02:28Z | - |
| dc.date.available | 2018-06-18T03:02:28Z | - |
| dc.date.created | 2012-03-19 | - |
| dc.date.issued | 2011-09-29 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/59926 | - |
| dc.publisher | THE JAPAN SOCIETY OF APPLIED PHYSICS | - |
| dc.relation.isPartOf | SSDM(International Conference on Solid State Devices and Materials) | - |
| dc.title | Impact of OFF-state Degradation under Dynamic Stress on Reliability of Nanoscale n-Channel Metal-Oxide Semiconductor Field-Effect Transistors at Elevated Temperature | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | SSDM(International Conference on Solid State Devices and Materials) | - |
| dc.citation.conferencePlace | JA | - |
| dc.citation.title | SSDM(International Conference on Solid State Devices and Materials) | - |
| dc.contributor.affiliatedAuthor | 강봉구 | - |
| dc.contributor.affiliatedAuthor | 이남현 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 강봉구KANG, BONG KOO
- Dept of Electrical Enginrg