Dielectric Degradation and Breakdown of High-k/Metal Gate Stack nMOSFETs
- Title
- Dielectric Degradation and Breakdown of High-k/Metal Gate Stack nMOSFETs
- Authors
- 정윤하
- Date Issued
- 2012-06-28
- Publisher
- IEEK
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/61721
- Article Type
- Conference
- Citation
- 2012 IEEK Summer Conference, 2012-06-28
- Files in This Item:
- There are no files associated with this item.
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