Full metadata record
DC Field | Value | Language |
dc.contributor.author | 강봉구 | - |
dc.contributor.author | 김동우 | - |
dc.date.accessioned | 2018-06-18T06:03:31Z | - |
dc.date.available | 2018-06-18T06:03:31Z | - |
dc.date.created | 2013-02-28 | - |
dc.date.issued | 2012-10-01 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/62646 | - |
dc.publisher | Microelectronics Reliability | - |
dc.relation.isPartOf | European Symposium on Reliability of Electron Devices, Failure Physics and Analysis | - |
dc.title | Enhanced degradation of n-MOSFETs with high-k/metal gate stacks under channel hot-carrier/gate-induced drain leakage alternating stress | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | European Symposium on Reliability of Electron Devices, Failure Physics and Analysis | - |
dc.citation.conferencePlace | IT | - |
dc.citation.title | European Symposium on Reliability of Electron Devices, Failure Physics and Analysis | - |
dc.contributor.affiliatedAuthor | 강봉구 | - |
dc.contributor.affiliatedAuthor | 김동우 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
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