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dc.contributor.author김영환-
dc.contributor.author김재훈-
dc.date.accessioned2018-06-18T10:33:33Z-
dc.date.available2018-06-18T10:33:33Z-
dc.date.created2014-03-10-
dc.date.issued2012-12-12-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/66366-
dc.publisherIEEE CAS, CSIC, CNM-
dc.relation.isPartOfInternational Conference on Electronics, Circuits, and Systems (ICECS)-
dc.relation.isPartOfINTERNATIONAL CONFERENCE ON ELECTRONICS, CIRCUITS, AND SYSTEMS (ICECS)-
dc.titleStatistical Leakage Analysis Using The Deterministic Modeling of Cell Leakage Current-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitationInternational Conference on Electronics, Circuits, and Systems (ICECS), pp.837 - 840-
dc.citation.conferenceDate2012-12-09-
dc.citation.conferencePlaceSP-
dc.citation.endPage840-
dc.citation.startPage837-
dc.citation.titleInternational Conference on Electronics, Circuits, and Systems (ICECS)-
dc.contributor.affiliatedAuthor김영환-
dc.contributor.affiliatedAuthor김재훈-
dc.description.journalClass1-
dc.description.journalClass1-

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김영환KIM, YOUNG HWAN
Dept of Electrical Enginrg
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