Full metadata record
DC Field | Value | Language |
dc.contributor.author | 박찬경 | - |
dc.contributor.author | 김보화 | - |
dc.contributor.author | 김영태 | - |
dc.date.accessioned | 2018-06-18T11:11:43Z | - |
dc.date.available | 2018-06-18T11:11:43Z | - |
dc.date.created | 2014-04-08 | - |
dc.date.issued | 2013-10-24 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/67024 | - |
dc.publisher | 대한금속재료학회 | - |
dc.relation.isPartOf | 추계 금속재료학회 | - |
dc.title | Atom Probe Tomography Analyses of Thin poly-Si/SiO2 Multi-layer and Appropriate | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | 추계 금속재료학회 | - |
dc.citation.conferencePlace | KO | - |
dc.citation.title | 추계 금속재료학회 | - |
dc.contributor.affiliatedAuthor | 박찬경 | - |
dc.contributor.affiliatedAuthor | 김보화 | - |
dc.contributor.affiliatedAuthor | 김영태 | - |
dc.description.journalClass | 2 | - |
dc.description.journalClass | 2 | - |
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