Quantitative 2-D strain mapping of InGaN/GaN nanowire-heterostructure using dark-field inline holography
- Title
- Quantitative 2-D strain mapping of InGaN/GaN nanowire-heterostructure using dark-field inline holography
- Authors
- 오상호; 이자경; 박범수; 송경; 김종규
- Date Issued
- 2014-11-13
- Publisher
- 한국현미경학회
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/68861
- Article Type
- Conference
- Citation
- 2014 Fall Korean Society of Microscopy Conference, 2014-11-13
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- There are no files associated with this item.
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