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dc.contributor.author오상호-
dc.contributor.author백경준-
dc.contributor.author황현상-
dc.date.accessioned2018-06-19T00:30:04Z-
dc.date.available2018-06-19T00:30:04Z-
dc.date.created2015-02-26-
dc.date.issued2014-11-13-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/68862-
dc.publisher한국현미경학회-
dc.relation.isPartOf2014 Fall Korean Society of Microscopy Conference-
dc.titleDirect Observation of Interfacial Switching Processes of PrxCa1-xMnO3–based ReRAM Devices using in situ TEM-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitation2014 Fall Korean Society of Microscopy Conference-
dc.citation.conferencePlaceKO-
dc.citation.title2014 Fall Korean Society of Microscopy Conference-
dc.contributor.affiliatedAuthor오상호-
dc.contributor.affiliatedAuthor백경준-
dc.contributor.affiliatedAuthor황현상-
dc.description.journalClass2-
dc.description.journalClass2-

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황현상HWANG, HYUNSANG
Dept of Materials Science & Enginrg
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