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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 강봉구 | - |
| dc.contributor.author | 서지훈 | - |
| dc.contributor.author | 김강준 | - |
| dc.contributor.author | 손동희 | - |
| dc.date.accessioned | 2018-06-19T03:01:07Z | - |
| dc.date.available | 2018-06-19T03:01:07Z | - |
| dc.date.created | 2016-02-19 | - |
| dc.date.issued | 2015-11-02 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/70610 | - |
| dc.publisher | The Japan Society of Applied Physics | - |
| dc.relation.isPartOf | International Workshop on Dielectric thin films for future electron devices(IWDTF) | - |
| dc.title | Length dependency expectation of negative bias temperature instability | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | International Workshop on Dielectric thin films for future electron devices(IWDTF) | - |
| dc.citation.conferencePlace | JA | - |
| dc.citation.title | International Workshop on Dielectric thin films for future electron devices(IWDTF) | - |
| dc.contributor.affiliatedAuthor | 강봉구 | - |
| dc.contributor.affiliatedAuthor | 서지훈 | - |
| dc.contributor.affiliatedAuthor | 김강준 | - |
| dc.contributor.affiliatedAuthor | 손동희 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 강봉구KANG, BONG KOO
- Dept of Electrical Enginrg