Self-Relaxed Conductive Filament in ReRAM Analyzed by In-situ TEM and Atom Probe Tomography
- Title
- Self-Relaxed Conductive Filament in ReRAM Analyzed by In-situ TEM and Atom Probe Tomography
- Authors
- 박찬경; 채병규
- Date Issued
- 2015-11-24
- Publisher
- Japanese Society of Microscopy
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/70838
- Article Type
- Conference
- Citation
- EAMC-2, 2015-11-24
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.